Atomic Force Microscopy (AFM)
Atomic Force Microscopy (AFM) is a high-resolution surface characterization technique used to analyze topography and nanoscale properties of materials.
ezAFM | Atomic Force Microscope
Introducing the ezAFM, the definitive compact atomic force microscope (AFM) designed for cutting-edge research without the constraints of a large, dedicated space.
Nanomagnetics
Academic
Chemicals
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